IRIS-GAN: Staged Specialist Detection of Deepfake Faces
Authors: Jaume M. Trenchs, Veronica Sanz
Published: 2026-06-03 13:29:24+00:00
Comment: 20 pages, 10 figures
AI Summary
The paper introduces IRIS-GAN, a specialist forensic detector for synthetic face images generated by GANs, designed to handle cross-generator shift. It employs a staged training protocol that progressively exposes the detector to increasingly complex GAN families while retaining earlier ones. This strategy achieves high fake-detection rates (above 99%) across considered GAN families and demonstrates improved generalization to unseen GANs compared to one-shot training.
Abstract
We introduce IRIS-GAN, a specialist forensic detector for synthetic face images under cross-generator shift. Rather than addressing universal synthetic-image detection, we focus on faces generated by generative adversarial networks (GANs), which are state-of-the-art in deepfake content, and train the detector through staged exposure to increasingly demanding GAN families while retaining earlier generators. The final model reaches fake-detection rates above 99% across the GAN families considered and classifies an external real-face dataset with 98.9% accuracy. Grad-CAM analysis further reveals measurable generator-dependent spatial response patterns, which remain informative for a secondary heatmap-only classifier. Out-of-family tests on diffusion-generated faces confirm that IRIS-GAN is a specialist detector, with some capability to reach non-GAN deepfakes. These results establish staged training as an effective strategy for robust GAN-face forensics.